核心概念
TRACE-GPT improves fault detection in semiconductor manufacturing with unsupervised learning.
要約
The paper introduces TRACE-GPT, a model for pre-training time-series sensor data and detecting faults in semiconductor manufacturing. It addresses challenges of abnormal data scarcity, small training data, and mixed normal types. The model outperforms unsupervised models on open datasets and process logs. It combines temporal convolutional embedding and Generative Pre-trained Transformers for effective anomaly detection.
統計
TRACE-GPT outperforms previous models with the highest F1 score at Equal Error Rate (EER).
The model shows better performance than supervised state-of-the-art baselines.
The CVD dataset has a fault rate of 1.39%, augmented based on previous research.
引用
"Our model has the highest F1 score at Equal Error Rate (EER) across all datasets."
"TRACE-GPT demonstrates effective anomaly detection in semiconductor manufacturing processes."